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GaN-HEMT RELIABILITY

A Seminar by Professor Roberto Menozzi, Department of Information Technology, University of Parma, Parma, Italy

What
When 2008-08-29
from 16:00 to 17:00
Where Billings Room (Room 3.04) EECE
Contact Name Prof. Lorenzo Faraone
Contact Email
Contact Phone 6488 3104
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For the last few years, GaN-based technologies have been delivering many of the promises made in their earliest development stages. As usual, when a technology moves out of the labs and into production lines, reliability becomes a major concern.  GaN-based HEMTs, in particular, owe most of their appeal and success to the ability to operate at higher power densities and temperatures...

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