GaN-HEMT RELIABILITY
A Seminar by Professor Roberto Menozzi, Department of Information Technology, University of Parma, Parma, Italy
| What | |
|---|---|
| When |
2008-08-29 16:00
2008-08-29 17:00
2008-08-29 from 16:00 to 17:00 |
| Where | Billings Room (Room 3.04) EECE |
| Contact Name | Prof. Lorenzo Faraone |
| Contact Email | faraone@ee.uwa.edu.au |
| Contact Phone | 6488 3104 |
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For the last few years, GaN-based technologies have been delivering many of the promises made in their earliest development stages. As usual, when a technology moves out of the labs and into production lines, reliability becomes a major concern. GaN-based HEMTs, in particular, owe most of their appeal and success to the ability to operate at higher power densities and temperatures...